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2D MEMS Probe Card

MEMS probe cards are mainly used for testing advanced process wafers, with significant advantages such as small Pad/Bump pitch, multi-sites, and high pin count.
Features

• OD: 50um-150um

• Pitch: ≥ 45um

• High pin count: 40k+

• Kelvin test available

• Over rejection: ≤1%

• Tri-temp. test: -55°C~175°C

Purchase Consultation
Contact number
+86 0512-8717 6308
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