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Memory Test Socket

Memory test socket is a specialized interface component designed for testing memory chips (such as DRAM, NAND Flash, etc.). Its core feature is the use of conductive elastomer sheet to replace traditional metal probes or contacts, enabling electrical connections with the chip's pins.
Features

? Pitch: ≥0.35mm

? Short signal path & low contact resistance: <100mΩ

? High pin count: ≤9,000 pins

? Outstanding contact stability?

? No ball damage

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